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Fabrication and characterization techniques – MCQs – EE

1. Nanomaterial fabrication involves controlling material dimensions below:

(A) 1 mm


(B) 100 nm


(C) 10 µm


(D) 1 µm



2. The top-down approach in nanofabrication refers to:

(A) Breaking down bulk material into nanosized particles


(B) Assembling atoms and molecules


(C) Growing nanostructures atom by atom


(D) Self-assembly of molecules



3. The bottom-up approach involves:

(A) Assembling atoms or molecules to form nanostructures


(B) Etching bulk material


(C) Milling large structures


(D) Cutting thin films



4. Photolithography is commonly used for:

(A) Pattern transfer in semiconductor fabrication


(B) Growing nanowires


(C) Coating polymers


(D) Mixing nanofluids



5. The main light source in photolithography is typically:

(A) Ultraviolet (UV) light


(B) Infrared light


(C) Visible light


(D) X-rays



6. Electron beam lithography (EBL) provides:

(A) Very high resolution patterning


(B) Low-cost mass production


(C) Large-area fabrication


(D) Chemical etching



7. Nanoimprint lithography works by:

(A) Mechanically pressing a mold into a resist layer


(B) Using UV light for exposure


(C) Magnetic field alignment


(D) Wet etching



8. Chemical Vapor Deposition (CVD) is a:

(A) Bottom-up thin film deposition method


(B) Mechanical cutting process


(C) Wet etching method


(D) Physical cleaning process



9. In Physical Vapor Deposition (PVD), material is:

(A) Evaporated or sputtered and condensed on a substrate


(B) Grown chemically in solution


(C) Deposited using bacteria


(D) Formed by etching



10. Atomic Layer Deposition (ALD) is characterized by:

(A) Layer-by-layer atomic precision deposition


(B) Random film growth


(C) High-temperature oxidation


(D) Plasma etching



11. Etching is used to:

(A) Remove specific material layers selectively


(B) Deposit metal layers


(C) Add polymer coating


(D) Grow nanocrystals



12. Wet etching removes material through:

(A) Chemical solutions


(B) Ion bombardment


(C) Mechanical cutting


(D) Thermal diffusion



13. Dry etching commonly uses:

(A) Plasma or reactive ions


(B) Acids


(C) Solvents


(D) Mechanical abrasives



14. Scanning Electron Microscopy (SEM) provides:

(A) High-resolution surface imaging using electron beams


(B) Internal atomic structure


(C) Thermal conductivity data


(D) Magnetic response



15. The resolution of SEM is typically:

(A) A few nanometers


(B) A few micrometers


(C) A few millimeters


(D) Several centimeters



16. Transmission Electron Microscopy (TEM) is used for:

(A) Atomic-scale internal imaging of thin samples


(B) Measuring surface roughness


(C) Detecting gas molecules


(D) Spectroscopy only



17. Atomic Force Microscopy (AFM) measures:

(A) Surface topography at the nanoscale


(B) Temperature variation


(C) Optical reflection


(D) Electrical resistance



18. In AFM, the probe tip interacts with:

(A) Surface atoms of the sample


(B) Magnetic fields


(C) Sound waves


(D) Laser beams



19. X-ray Diffraction (XRD) is primarily used for:

(A) Determining crystal structure and phase identification


(B) Measuring optical absorption


(C) Detecting surface roughness


(D) Measuring electrical resistance



20. The basic principle of XRD is:

(A) Diffraction of X-rays by crystal planes


(B) Absorption of X-rays


(C) Scattering of light waves


(D) Electron emission



21. Energy Dispersive X-ray Spectroscopy (EDS) is often used with:

(A) SEM or TEM


(B) AFM


(C) Optical microscope


(D) STM only



22. EDS provides information about:

(A) Elemental composition


(B) Surface roughness


(C) Crystallinity


(D) Optical properties



23. Raman Spectroscopy is based on:

(A) Inelastic scattering of light


(B) Elastic reflection


(C) Magnetic absorption


(D) Ionization of atoms



24. Fourier Transform Infrared (FTIR) Spectroscopy is used to:

(A) Identify chemical bonds and functional groups


(B) Measure electrical conductivity


(C) Detect crystal grain size


(D) Observe magnetic domains



25. Ellipsometry is a technique used for measuring:

(A) Thin film thickness and refractive index


(B) Electrical conductivity


(C) X-ray absorption


(D) Surface magnetism



26. Focused Ion Beam (FIB) systems are used for:

(A) Milling, imaging, and micro/nanofabrication


(B) Optical lithography


(C) Wet chemical synthesis


(D) Polymer molding



27. The resolution of a TEM can reach up to:

(A) Sub-nanometer scale


(B) 1 µm


(C) 10 nm


(D) 100 µm



28. Self-assembly in nanofabrication refers to:

(A) Spontaneous organization of molecules into ordered structures


(B) Manual alignment of atoms


(C) Chemical etching


(D) Thermal oxidation



29. Langmuir-Blodgett technique is used for:

(A) Forming monolayers of organic molecules on substrates


(B) Cutting thin films


(C) Oxidizing metals


(D) Cleaning surfaces



30. The major challenge in nanofabrication is:

(A) Achieving precise control at atomic scale


(B) High temperature requirement


(C) Magnetic alignment


(D) Optical interference



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